Physical Properties |
Analysis item |
Analysis Method |
Analysis Result |
Appearance of Si particulates |
-- |
|
Micrographs particulates |
SEM |
|
Average particle size |
LS |
8.13μm(Appendix-A) |
Chemical Properties |
1 |
Water content |
Oven dryer
|
<0.5% |
2 |
Elemental Analysis |
XRF
|
Appendix-B |
3 |
SiC %
|
Chemical method |
28.5%
|
4 |
Si % |
Chemical method |
71.5%
|
5 |
TCLP |
NIEA M104.01C |
(table 1) |
*The percentage of weight reduced after dry sample for 24 hours at 105 °C |
1 |
TCLP |
NIEA201.14C& NIEAM104.01C |
Appendix-C |
|